SNA Testing Configurations and Techniques

B. C. Gearhart

The diagrams below show various configurations where SDTF^tm may be utilized to test SNA network components.

The following notation is used in the diagrams:
SDTF - SNA Development Test Facility
LAN - Local Area Network connection using Token Ring or Ethernet
SDLC/X.25 - Wide Area Network connection using SDLC or X.25
C - Converter (i.e. Bridge, Router, FRAD, Gateway, LLC converter, etc)
IUT - Implementation Under Test, i.e. 3270, 5250, RJE, or LU6.2 (SDTF may also be used as an IUT for testing of 'C' devices)

1.  SDTF--LAN----------------------------IUT
2.  SDTF--SDLC/X.25----------------------IUT

Configurations 1 and 2, above, would be used by SNA 3x74/5250/RJE Emulation and LU6.2 APPC/APPN developers and end users evaluating these products.

3.  SDTF--LAN-----------C-----LAN--------IUT
4.  SDTF--LAN-----------C-----SDLC/X.25--IUT
5.  SDTF--SDLC/X.25-----C-----LAN--------IUT
6.  SDTF--SDLC/X.25-----C-----SDLC/X.25--IUT

Configurations 3-6, above, would be used by Gateway and LLC converter developers and end-users evaluating these products.

7.  SDTF--LAN--------C--?--C--LAN--------IUT
8.  SDTF--LAN--------C--?--C--SDLC/X.25--IUT
9.  SDTF--SDLC/X.25--C--?--C--LAN--------IUT
10. SDTF--SDLC/X.25--C--?--C--SDLC/X.25--IUT

Configurations 7-9, above, would be used by Bridge, Router, FRAD, and DLSw developers and end users evaluating these products.

The 'C' or converter devices in configurations 3-10 may be non-intrusive SNA traffic passing or distribute SNA processing in a proprietary manner. DSPU (down stream PU) gateways and LLC converters are intended to be non-intrusive as are the Bridges, Routers, FRADs, and DLSw devices.

In order to validate the SNA operation and measure the performance of non-intrusive implementations, tests should be run with configurations 1 or 2 first. Then, the same tests should be run with the desired configurations 3-10. If the devices are truly non-intrusive they should have no impact on the run/pass/fail counts of SNA layer validation tests. The performance tests results should be evaluated for either no degradation or an acceptable level.

The following test libraries should be used for validation of 3x74/5250/RJE operations:

dlc, dlca/SDLC
pc/Path Control
tc/Transmission Control
sc/Session Control
dfc/Data Flow Control
ps/Presentation Services
snaa/SNA Multi-PU/LU Session Control
snams/SNA Management Services
eff74/3270 Error Free Flow
eff5250/5250 Effort Free Flow

The following test libraries should be used for evaluation of 3x74/5250/RJE performance:

barts/Display Functions and Performance
lu2a/Advanced Display Functions and Performance
lu2b/Single LU performance/stress tests
lu2c/Multi-LU performance/stress tests
lu2d/Large Screen, Large RU, EHLLAPI, Enhanced CUT Functions, WSF File Transfer
lu2e/Write Structure Field Functions and Performance
lu2f/Host Application Demos II
lu2g/3270 Data Compression
lu7/5250 Datastream
lu7a/5250 Multi-LU
dspt/5250 Pass-Through
ehlliut/EHLLAPI programs which execute on the Implementation Under Test (IUT)

The following test libraries should be used for validation of LU6.2 APPC/APPN operation:

dlc, dlca, dlcn, dlcs/SDLC
pc62/ Path Control
tc62 /Transmission Control
sc62/ Session Control
dfc62/ Data Flow Control
rm62/ Resource Manager
sm62/ Session Manager
co62/ Control Operator
lu62b/ LU6.2 Series B SAA CPIC
eff62/LU6.2 Error Free Flow
aenpri/ APPN EN Primary XID Tests
aensec/ APPN EN Secondary XID Tests
aenneg/APPN EN Negotiable XID Tests
aencpcp/APPN EN CP-CP Tests
aenbind/APPN EN BIND Tests
aenpi/APPN EN Pacing Tests
annpri/APPN NN Primary XID Tests
annsec/APPN NN Secondary XID Tests
annneg/APPN NN Negotiable XID Tests
anncpcp/APPN NN CP-CP Tests
annbind/APPN NN BIND Tests
annpi/APPN NN Pacing Tests
appc3270/APPC3270 Data Stream

The following test libraries should be used for evaluation of LU6.2 APPC/APPN performance:

lu62a/LU6.2 Series A Performance
lu62c/LU6.2 Series C Performance